TY - JOUR ID - 803 TI - An Investigation of the Effects of Crack on the Zone of Pull-in Suppression in MicroElectromechanical Systems Using High-Frequency Excitation JO - AUT Journal of Mechanical Engineering JA - AJME LA - en SN - 2588-2937 AU - Hassannejad, R. AU - Amiri Jahed, Sh. AD - Department of Mechanical Engineering, University of Tabriz, Tabriz, Iran Y1 - 2017 PY - 2017 VL - 1 IS - 1 SP - 99 EP - 108 KW - Micro-beam KW - Crack KW - High frequency voltage excitation KW - Suppression of pull-in phenomenon KW - Stability zone DO - 10.22060/mej.2016.803 N2 - In this paper, the pull-in phenomenon is suppressed using a range of values of amplitudeand frequency of high-frequency voltage excitations in the post pull-in condition of the cracked microelectromechanical systems. These specified ranges are named as stable zones. It is investigated the effects of the crack parameters (depth and location) on changes of these zones, in the post pull-in condition. It is shown that these zones have different areas for different crack parameters. The cracked micro-beam ismodeled as a single-degree-of-freedom systems consist of mass-spring-damper and the motion equationof the cracked micro-beam is extracted. The method of direct partition of motion is used to split the fastand slow dynamics. By means of slow dynamic part, the effects of the crack on the averaged position ofvibration of cracked micro-beam are investigated versus voltage amplitude and frequency of the highfrequency AC. By approaching the crack to the fixed end or increasing the depth of crack, the stabilityzone reduced. Therefore, the pull-in instability can be suppressed in the lower range of amplitude andfrequency. This method can be used in sensors’ health-monitoring and one can predict the parameters ofthe crack using this method. UR - https://ajme.aut.ac.ir/article_803.html L1 - https://ajme.aut.ac.ir/article_803_45d122f65452bb479b3a85861b584dee.pdf ER -